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IEC 60749-16:2003

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

IEC 60749-16:2003

PRIS 180,00 kr


 

IEC 60749-15:2003

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

IEC 60749-15:2003

PRIS 180,00 kr


 

IEC 60749-13:2002

Semiconductor devices - Mechanical and climatic test method - Part 13: Salt atmosphere

IEC 60749-13:2002

PRIS 180,00 kr


 

IEC 60749-11:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

IEC 60749-11:2002

PRIS 180,00 kr


 

IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

IEC 60749-12:2002

PRIS 90,00 kr


 

IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

IEC 60749-10:2002

PRIS 90,00 kr


 

IEC 60749-9:2002

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

IEC 60749-9:2002

PRIS 180,00 kr


 

IEC 60749-7:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

IEC 60749-7:2002

PRIS 180,00 kr


 

IEC 60749-6:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

IEC 60749-6:2002

PRIS 90,00 kr


 

IEC 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

IEC 60749-5:2003

PRIS 180,00 kr


 

IEC 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

IEC 60749-4:2002

PRIS 180,00 kr


 

IEC 60749-3:2002

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

IEC 60749-3:2002

PRIS 90,00 kr


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